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NIST - CALNET

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New Calibration NIST CALNET

New Calibration

Integrated-Circuit Artifacts

Substrate:	Quartz
Cassette Lot#:	TOYS277022
Wafer#:	1
Die Type:	Reference
Fabrication Date:	08-04-1997
Design:	Q1R.xic

Upload Data

Drop files here to upload

c:\Data\QR1_L1.dat
c:\Data\QR1_L2.dat
c:\Data\QR1_L3.dat
c:\Data\QR1_L4.dat
c:\Data\QR1_L5.dat
c:\Data\QR1_L6.dat
c:\Data\QR1_L7.dat
c:\Data\QR1_L8.dat

Autodetect
Instrument:
Probes:
Min Freq:	0.100 GHz
Max Freq:	110.0 GHz
Number of Data points	512
Pre-processed:
Post-processed:

Calibrate

DONE

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Using the most up-to-date NIST algorithms, the customer is able to calibrate their devices

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